Automatized Diffraction Pattern Recognition for Scanning Surface Crystallography of Polycrystalline Materials

DASHH Doctoral Researcher: Radik Batraev

Supervisors: Prof. Andreas Stierle (DESY/UHH), Dr. Vedran Vonk (DESY), Prof. Peer Stelldinger (HAW)

Understanding structure-property relationships in polycrystalline (structural) materials can only advance with state-of-the-art characterization. Probing the structure by x-rays has only recently become feasible, mostly by advances in nano-focusing. By scanning techniques, diffraction data of many different grains can be collected. This project aims at dealing with the data obtained from such experiments, in particular automated diffraction spot analysis and data reduction of 2D detector images.